Erratum: "Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory" [Appl. Phys. Express 13, 054002 (2020)]. (29th May 2020)

Record Type:: Journal Article
Title:: Erratum: "Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory" [Appl. Phys. Express 13, 054002 (2020)]. (29th May 2020)
Main Title:: Erratum: "Lateral charge migration induced abnormal read disturb in 3D charge-trapping NAND flash memory" [Appl. Phys. Express 13, 054002 (2020)]
Authors:: Wang, Fei
Cao, Rui
Kong, Yachen
Ma, Xiaolei
Zhan, Xuepeng
Li, Yuan
Chen, Jiezhi
Abstract:
Is Part Of:: Applied physics express. Volume 13:Number 7(2020)
Journal:: Applied physics express
Issue:: Volume 13:Number 7(2020)
Issue Display:: Volume 13, Issue 7 (2020)
Year:: 2020
Volume:: 13
Issue:: 7
Issue Sort Value:: 2020-0013-0007-0000
Page Start:
Page End:
Publication Date:: 2020-05-29
Subjects:: Physics -- Periodicals
Technology -- Periodicals
621.05
Journal URLs:: http://iopscience.iop.org/1882-0786/ ↗
http://ioppublishing.org/ ↗
DOI:: 10.35848/1882-0786/ab93a2 ↗
Languages:: English
ISSNs:: 1882-0778
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store
Ingest File:: 14073.xml