Cite
APA Citation
Ismail, M., Hashmi, A., Rana, A. M., & Kim, S. (2020). eradicating negative-Set behavior of TiO2-based devices by inserting an oxygen vacancy rich zirconium oxide layer for data storage applications. Nanotechnology, 31, . http://access.bl.uk/ark:/81055/vdc_100108255667.0x000058