Effect of surface stoichiometry on the non-alloyed ohmic contact to N-face n-GaN. (September 2020)
- Record Type:
- Journal Article
- Title:
- Effect of surface stoichiometry on the non-alloyed ohmic contact to N-face n-GaN. (September 2020)
- Main Title:
- Effect of surface stoichiometry on the non-alloyed ohmic contact to N-face n-GaN
- Authors:
- Zhou, Rui
Feng, Meixin
Wang, Jin
Zhong, Yaozong
Sun, Qian
Liu, Jianxun
Huang, Yingnan
Zhou, Yu
Gao, Hongwei
Ikeda, Masao
Li, Zhiyun
Zhao, Yanfei
Liu, Tong
Yang, Hui - Abstract:
- Highlights: This letter reveals the surface stoichiometry of N-face n-GaN has a significant effect on the electrical property of non-alloyed ohmic contact, and can be tuned by plasma treatment. Combining with X-ray photoelectron spectroscopy, we have confirmed that it is indispensable to remove GaOx layer prior to the metal deposition. More importantly, the contact property depends greatly on the plasma species and the radio frequency power. Finally, a non-alloyed ohmic contact to N-face n-GaN has been successfully achieved. Abstract: This letter reports a systematic study about the effect of surface stoichiometry induced by inductively coupled plasma (ICP) etching on the ohmic contact to N-face n-GaN. It is found that N-face n-GaN surface has a very high activity towards oxygen adsorption. And it is indispensable to remove GaOx layer on the N-face n-GaN surface prior to the metal deposition to realize ohmic contact. Moreover, the radio frequency power of the ICP etching and the plasma species greatly affect the surface stoichiometry and the electrical property of the ohmic contact to N-face n-GaN. X-ray photoelectron spectroscopy was implemented to characterize the surface stoichiometry of N-face n-GaN after plasma treatment and reveal the mechanism behind the phenomena. As a result, a non-alloyed ohmic contact to N-face n-GaN has been successfully achieved in a reproducible way.
- Is Part Of:
- Solid-state electronics. Volume 171(2020)
- Journal:
- Solid-state electronics
- Issue:
- Volume 171(2020)
- Issue Display:
- Volume 171, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 171
- Issue:
- 2020
- Issue Sort Value:
- 2020-0171-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-09
- Subjects:
- N-face n-GaN -- Ohmic contact -- Plasma treatment -- XPS -- Surface stoichiometry
Semiconductors -- Periodicals
Semiconducteurs -- Périodiques
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00381101 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.sse.2020.107863 ↗
- Languages:
- English
- ISSNs:
- 0038-1101
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8327.385000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14006.xml