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APA Citation
Carmignato, S., De Chiffre, L., Bosse, H., Leach, R., Balsamo, A., & Estler, W. (2020). dimensional artefacts to achieve metrological traceability in advanced manufacturing. CIRP annals, 69(2), 693–716. http://access.bl.uk/ark:/81055/vdc_100107825445.0x000064