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HARVARD Citation
Carmignato, S. et al. (2020). Dimensional artefacts to achieve metrological traceability in advanced manufacturing. CIRP annals. 69 (2), pp. 693-716. [Online].
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Carmignato, S. et al. (2020). Dimensional artefacts to achieve metrological traceability in advanced manufacturing. CIRP annals. 69 (2), pp. 693-716. [Online].