Reliability analysis of multilayer polymer aluminum electrolytic capacitors. (September 2020)

• Record Type: Journal Article
• Authors: Romero, Jose; Azarian, Michael H.; Pecht, Michael
• Is Part Of: Microelectronics and reliability. Volume 112(2020)
• Publication Date: 2020-09
• Subjects: Polymer aluminum electrolytic capacitors -- Temperature-humidity test -- Weibull -- Degradation analysis -- Electronics reliability -- HAST -- PEDOT; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2020.113725
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Multilayer polymer aluminum electrolytic capacitors represent one of the most recently developed capacitor technology; this paper presents a reliability analysis of multilayer polymer capacitors in elevated-temperature and humidity applications (85 °C). Three groups of capacitors were selected and tested at two different environmental conditions (85 °C/85% RH and 110 °C/85% RH with rated voltage bias). The times to failure were recorded, and a life model was developed that correlates the effects of temperature with the time to failure. This study provides insight into the primary failure modes of these components and guidelines for screening and parts selection. Highlights: The primary failure modes for MLPCs MLPCs MLPCsunder elevated temperature and humidity conditions were studied. A life model that correlates the effects of temperature and relative humidity for MLPCs was developed. A reliability estimation was conducted for MLPCs under elevated temperature and humidity conditions.