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HARVARD Citation
Floriduz, A. et al. (2020). High-energy proton irradiation effects on GaN hybrid-drain-embedded gate injection transistors. Microelectronics and reliability. p. . [Online].
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Floriduz, A. et al. (2020). High-energy proton irradiation effects on GaN hybrid-drain-embedded gate injection transistors. Microelectronics and reliability. p. . [Online].