Cite
HARVARD Citation
Siroky, G. et al. (2020). Lap shear test for solder materials: Local stress states and their effect on deformation and damage. Microelectronics and reliability. p. . [Online].
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Siroky, G. et al. (2020). Lap shear test for solder materials: Local stress states and their effect on deformation and damage. Microelectronics and reliability. p. . [Online].