Cite
MLA Citation
Yong Liu et al.. “Microstructure and ferroelectric properties of bi-excess Bi4Ti3O12 thin films grown on Si and Pt/Ti/SiO2/Si substrates.” Ferroelectrics, vol. 554, 2020, pp. 144–149. http://access.bl.uk/ark:/81055/vdc_100101653314.0x00005f