Cite
HARVARD Citation
Liu, Y. et al. (2020). Microstructure and ferroelectric properties of bi-excess Bi4Ti3O12 thin films grown on Si and Pt/Ti/SiO2/Si substrates. Ferroelectrics. pp. 144-149. [Online].
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Liu, Y. et al. (2020). Microstructure and ferroelectric properties of bi-excess Bi4Ti3O12 thin films grown on Si and Pt/Ti/SiO2/Si substrates. Ferroelectrics. pp. 144-149. [Online].