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APA Citation
Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., & Bijkerk, F. (2020). a semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence. Journal of synchrotron radiation, 27, 386–395. http://access.bl.uk/ark:/81055/vdc_100103411294.0x00003d