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APA Citation
Lin, Y., Gao, T., Pan, X., Kamenetska, M., & Thon, S. M. (2020). local Defects in Colloidal Quantum Dot Thin Films Measured via Spatially Resolved Multi‐Modal Optoelectronic Spectroscopy. Advanced materials, 32(11), n/a. http://access.bl.uk/ark:/81055/vdc_100102764918.0x00003d