Cite
APA Citation
Simbrunner, J., Schrode, B., Domke, J., Fritz, T., Salzmann, I., & Resel, R. (n.d.). an efficient method for indexing grazing‐incidence X‐ray diffraction data of epitaxially grown thin films. Acta crystallographica, 76(3), 345–357. http://access.bl.uk/ark:/81055/vdc_100102561573.0x000007