High‐Breakdown‐Voltage AlGaN Channel High‐Electron‐Mobility Transistors with Reduced Surface Field Technique. Issue 7 (24th January 2020)
- Record Type:
- Journal Article
- Title:
- High‐Breakdown‐Voltage AlGaN Channel High‐Electron‐Mobility Transistors with Reduced Surface Field Technique. Issue 7 (24th January 2020)
- Main Title:
- High‐Breakdown‐Voltage AlGaN Channel High‐Electron‐Mobility Transistors with Reduced Surface Field Technique
- Authors:
- Li, Zhongyang
Du, Lin
Lou, Jianshe
Jiang, Yun
Wang, Kunshu
Wen, Wei
Wang, Zhizhe
Zhao, Shenglei
Zhang, Jincheng
Hao, Yue - Other Names:
- Shahedipour-Sandvik F. Shadi guestEditor.
Qhalid Fareed guestEditor. - Abstract:
- Abstract : In this article, reduced surface field (RESURF) AlGaN channel high‐electron‐mobility transistors (HEMTs) are proposed and investigated through 2D simulation for the first time. p+ doping is designed to form the RESURF structure, and the impact of the p+ doping density and length on breakdown characteristics is investigated. The breakdown voltage (BV) can be improved from 819 V for a conventional HEMT to 1746 V for a RESURF HEMT with a p+ doping density of 5 × 10 18 cm −3 and length of 4 μm. Although the specific on‐resistance ( R ON ) increases from 1.45 to 2.16 mΩ cm 2, the power figure of merit (FOM) increases from 2.49 × 10 8 to 8.28 × 10 8 V 2 Ω −1 cm −2 by utilizing a RESURF structure. By increasing the Al component of the RESURF AlGaN channel HEMT, the BV can be improved from 1746 to 2199 V. However, the R ON also increases from 3.68 to 8.04 mΩ cm 2, which leads to a decreasing of the power FOM. Simulation and analysis suggest that RESURF AlGaN channel HEMTs have great potential in power electronic applications. Abstract : Reduced surface field (RESURF) technology is used to improve the breakdown voltage (BV) of AlGaN channel high‐electron‐mobility transistors (HEMTs) by the Silvaco‐ATLAS simulator. By optimizing the p+ doping density and length, the BV of RESURF AlGaN channel HEMTs is improved significantly, by 113%. The power figure of merit (FOM) increases by 232.5% through utilizing a RESURF structure.
- Is Part Of:
- Physica status solidi. Volume 217:Issue 7(2020)
- Journal:
- Physica status solidi
- Issue:
- Volume 217:Issue 7(2020)
- Issue Display:
- Volume 217, Issue 7 (2020)
- Year:
- 2020
- Volume:
- 217
- Issue:
- 7
- Issue Sort Value:
- 2020-0217-0007-0000
- Page Start:
- n/a
- Page End:
- n/a
- Publication Date:
- 2020-01-24
- Subjects:
- AlGaN channel high-electron-mobility transistors -- breakdown voltage -- reduced surface field
Solid state physics -- Periodicals
Solids -- Industrial applications -- Periodicals
530.41 - Journal URLs:
- http://onlinelibrary.wiley.com/ ↗
- DOI:
- 10.1002/pssa.201900793 ↗
- Languages:
- English
- ISSNs:
- 1862-6300
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 6475.210000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 13118.xml