Cite
MLA Citation
Filippo Giannazzo et al.. “Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy.” Advanced Electronic Materials, vol. 6, 2020, p. n/a. http://access.bl.uk/ark:/81055/vdc_100101550978.0x000006