Double cell upsets mitigation through triple modular redundancy. (February 2020)

• Record Type: Journal Article
• Authors: Li, Yuanqing; Breitenreiter, Anselm; Andjelkovic, Marko; Chen, Junchao; Babic, Milan; Krstic, Milos
• Is Part Of: Microelectronics journal. Volume 96(2020)
• Publication Date: 2020-02
• Subjects: Triple modular redundancy (TMR) -- Double cell upsets (DCUs); Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2019.104683
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: A triple modular redundancy (TMR) based design technique for double cell upsets (DCUs) mitigation is investigated in this paper. This technique adds three extra self-voter circuits into a traditional TMR structure to enable the enhanced error correction capability. Fault-injection simulations show that the soft error rate (SER) of the proposed technique is lower than 3% of that of TMR. The implementation of this proposed technique is compatible with the automatic digital design flow, and its applicability and performance are evaluated on an FIFO circuit.