Cite
APA Citation
Vogt, I., Nakamura, T., Motamedi, B., & Boit, C. (2018). device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. Microelectronics and reliability, 88, 11–15. http://access.bl.uk/ark:/81055/vdc_100069045844.0x000062