Cite
MLA Citation
Filippo Giannazzo et al.. “Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition‐Grown Monolayer MoS2 by Conductive Atomic Force Microscopy.” Physica status solidi, vol. 14, no. 2, 2020, p. n/a. http://access.bl.uk/ark:/81055/vdc_100099988827.0x00000d