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HARVARD Citation
Giannazzo, F. et al. (2020). Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition‐Grown Monolayer MoS2 by Conductive Atomic Force Microscopy. Physica status solidi. 14 (2), p. n/a. [Online].
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Giannazzo, F. et al. (2020). Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition‐Grown Monolayer MoS2 by Conductive Atomic Force Microscopy. Physica status solidi. 14 (2), p. n/a. [Online].