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APA Citation
Maity, G., Dubey, S., El-Azab, A., Singhal, R., Ojha, S., Kulriya, P. K., Dhar, S., Som, T., Kanjilal, D., & Patel, S. P. (2020). an assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC advances, 10(8), 4414–4426. http://access.bl.uk/ark:/81055/vdc_100099435528.0x000038