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HARVARD Citation
Maity, G. et al. (2020). An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC advances. 10 (8), pp. 4414-4426. [Online].
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Maity, G. et al. (2020). An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation. RSC advances. 10 (8), pp. 4414-4426. [Online].