Learning-based reliability assessment method for detection of permanent faults in clockless circuits. (September 2019)

• Record Type: Journal Article
• Authors: Aquino Guazzelli, Ricardo; Garay Trindade, Matheus; Fesquet, Laurent; Possamai Bastos, Rodrigo
• Is Part Of: Microelectronics and reliability. Volume 100/101(2019)
• Publication Date: 2019-09
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2019.06.057
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Permanent faults are a common issue of contemporary CMOS circuits during fabrication and its lifetime. In order to detect these faults, designers adopt logic and delay-oriented testing approaches to validate the circuit's structure. However, for clockless (i.e. asynchronous) circuits, applying well-known testing approaches is not trivial and bring undesirable overheads. To overcome that, the proposed method in this paper leverages the current signature properties of asynchronous circuits to detect permanent resistive-based faults. Through simulation experiments, we show the natural ability of asynchronous circuits in providing useful current signatures for identifying the presence of resistive-based faults. Moreover, the results demonstrate that our testing technique requires no extra circuitry or power ports to detect resistive-short faults ≤ 3 k Ω and resistive-open faults ≥ 70 k Ω.