Cite
APA Citation
Li, J., Morin, P., Liu, Q., Cheng, K., Loubet, N., Doris, B., & Gaudiello, J. (n.d.). elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations. Microscopy and microanalysis, 21, 1967–1968. http://access.bl.uk/ark:/81055/vdc_100040771046.0x000051