Cite
HARVARD Citation
Li, J. et al. (n.d.). Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations. Microscopy and microanalysis. pp. 1967-1968. [Online].
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Li, J. et al. (n.d.). Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations. Microscopy and microanalysis. pp. 1967-1968. [Online].