Cite
APA Citation
Reisinger, M., Ostermaier, C., Tomberger, M., Zechner, J., Sartory, B., Ecker, W., Daumiller, I., & Keckes, J. (2018). matching in-situ and ex-situ recorded stress gradients in an AlxGa1 − xN Heterostructure: Complementary wafer curvature analyses in time and space. Scripta materialia, , 50–54. http://access.bl.uk/ark:/81055/vdc_100056678531.0x000013