Cite
HARVARD Citation
Reisinger, M. et al. (2018). Matching in-situ and ex-situ recorded stress gradients in an AlxGa1 − xN Heterostructure: Complementary wafer curvature analyses in time and space. Scripta materialia. pp. 50-54. [Online].
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Reisinger, M. et al. (2018). Matching in-situ and ex-situ recorded stress gradients in an AlxGa1 − xN Heterostructure: Complementary wafer curvature analyses in time and space. Scripta materialia. pp. 50-54. [Online].