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Hong, L., Kuffner, T. A., & Martin, R. (n.d.). on overfitting and post-selection uncertainty assessments. Biometrika, 105, 221–224. http://access.bl.uk/ark:/81055/vdc_100095482571.0x00005e
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Hong, L., Kuffner, T. A., & Martin, R. (n.d.). on overfitting and post-selection uncertainty assessments. Biometrika, 105, 221–224. http://access.bl.uk/ark:/81055/vdc_100095482571.0x00005e