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APA Citation
Wu, H., Böttger, R., Couffignal, F., Gutzmer, J., Krause, J., Munnik, F., Renno, A. D., Hübner, R., Wiedenbeck, M., & Ziegenrücker, R. (2019). 'Box‐Profile' Ion Implants as Geochemical Reference Materials for Electron Probe Microanalysis and Secondary Ion Mass Spectrometry. Geostandards and geoanalytical research, 43(4), 531–541. http://access.bl.uk/ark:/81055/vdc_100095344610.0x00001a