Cite

MLA Citation

    Hengze Qu et al.. “Electronic structure and transport properties of 2D RhTeCl: a NEGF-DFT study.” Nanoscale, vol. 11, no. 43, 2019, pp. 20461–20466. http://access.bl.uk/ark:/81055/vdc_100094889368.0x000035
  
Back to record