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MLA Citation
Yaping Yan et al.. “Accumulated and aggregated shifting of intensity for defect detection on micro 3D textured surfaces.” Pattern recognition, vol. 98, n.d., p. . http://access.bl.uk/ark:/81055/vdc_100094620855.0x00005c
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Yaping Yan et al.. “Accumulated and aggregated shifting of intensity for defect detection on micro 3D textured surfaces.” Pattern recognition, vol. 98, n.d., p. . http://access.bl.uk/ark:/81055/vdc_100094620855.0x00005c