Millimeter-wave AlGaN/GaN HEMTs breakdown voltage enhancement by an air-bridge recessed source field plate (RSFP). (October 2019)
- Record Type:
- Journal Article
- Title:
- Millimeter-wave AlGaN/GaN HEMTs breakdown voltage enhancement by an air-bridge recessed source field plate (RSFP). (October 2019)
- Main Title:
- Millimeter-wave AlGaN/GaN HEMTs breakdown voltage enhancement by an air-bridge recessed source field plate (RSFP)
- Authors:
- Zhang, S.
Wei, K.
Ma, X.H.
Zhang, Y.C.
Asif, M.
Liu, G.G.
Huang, S.
Zheng, Y.K.
Wang, X.H.
Niu, J.B.
Lei, T.M.
Liu, X.Y. - Abstract:
- Highlights: A novel RSFP for mm-wave GaN HEMT is proposed, resulting in a reduced peak E-field. Millimeter-wave AlGaN/GaN HEMT with RSFP show higher VBR and lower current collapse. A high frequency performance is maintaining for the device after integrating RSFP. Abstract: In this paper, an innovative air-bridge recessed source field plate is implemented into the fabrication of high voltage mm-wave GaN high-electron-mobility transistors (HEMTs). The device integrates a metal field plate (FP) and an air-bridge FP that locate over the gate region and land between the gate and drain. The reduced peak electric field contributes to a three-terminal breakdown voltage of 144 V for GaN HEMTs with L SD = 2.4 μm, which is 96 V for the normal mm-wave device. One order of magnitude lower in off-state leakage currents and well suppressed current collapse are also achieved. Particularly, slight increase in C gs and C gd was obtained after applying the air-bridge field plate, keeping the high frequency characteristic of mm-wave devices. The technology might attract significant attention in mm-wave GaN HEMTs.
- Is Part Of:
- Solid-state electronics. Volume 160(2019)
- Journal:
- Solid-state electronics
- Issue:
- Volume 160(2019)
- Issue Display:
- Volume 160, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 160
- Issue:
- 2019
- Issue Sort Value:
- 2019-0160-2019-0000
- Page Start:
- Page End:
- Publication Date:
- 2019-10
- Subjects:
- GaN HEMTs -- Breakdown voltage -- Parasitic capacitance -- Field plate
Semiconductors -- Periodicals
Semiconducteurs -- Périodiques
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00381101 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.sse.2019.107629 ↗
- Languages:
- English
- ISSNs:
- 0038-1101
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8327.385000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 11675.xml