Cite
MLA Citation
Ryo Yokogawa et al.. “Evaluation of controlled strain in silicon nanowire by UV Raman spectroscopy.” Japanese journal of applied physics, vol. 56, n.d., p. . http://access.bl.uk/ark:/81055/vdc_100087648315.0x000062
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Ryo Yokogawa et al.. “Evaluation of controlled strain in silicon nanowire by UV Raman spectroscopy.” Japanese journal of applied physics, vol. 56, n.d., p. . http://access.bl.uk/ark:/81055/vdc_100087648315.0x000062