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HARVARD Citation
Müller, M. et al. (n.d.). Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant. Metrologia. pp. 653-662. [Online].
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Müller, M. et al. (n.d.). Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant. Metrologia. pp. 653-662. [Online].