Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant. (4th August 2017)

• Record Type: Journal Article
• Authors: Müller, Matthias; Beckhoff, Burkhard; Beyer, Edyta; Darlatt, Erik; Fliegauf, Rolf; Ulm, Gerhard; Kolbe, Michael
• Is Part Of: Metrologia. Volume 54:Number 5(2017:Oct.)
• Page Start: 653
• Page End: 662
• Publication Date: 2017-08-04
• Subjects: measurement techniques -- surface characterization -- precision measurements -- fundamental constants -- Avogadro constant -- x-ray spectrometry -- photoelectron spectroscopy; Weights and measures -- Periodicals; Weights and Measures -- Periodicals; 530.805
• DOI: 10.1088/1681-7575/aa73c5
• Languages: English
• ISSNs: 0026-1394

Abstract

Abstract: For the quantitative surface characterization of a monocrystalline silicon sphere, PTB has constructed and put into operation an analytical instrument, which combines x-ray fluorescence and x-ray photoelectron spectroscopy techniques. The main objective of this novel instrument is the characterization of the oxide layer and unintentional contaminations, e.g. from hydrocarbons. It is equipped with a ball manipulator allowing measurements at each point on the surface of ball-shaped samples with a diameter of about 93.7 mm. Monocrystalline silicon spheres with this diameter allow a realization of the SI base unit of mass.