An accurate behavioral model for single-photon avalanche diode statistical performance simulation. (January 2018)

• Record Type: Journal Article
• Authors: Xu, Yue; Zhao, Tingchen; Li, Ding
• Is Part Of: Superlattices and microstructures. Volume 113(2018)
• Page Start: 635
• Page End: 643
• Publication Date: 2018-01
• Subjects: Single-photon avalanche diodes -- Behavioral simulation model -- Dark counts -- After-pulsing -- Verilog-A hardware description language; Superlattices as materials -- Periodicals; Microstructure -- Periodicals; Semiconductors -- Periodicals; Superréseaux -- Périodiques; Microstructure (Physique) -- Périodiques; Semiconducteurs -- Périodiques; 621.38152
• DOI: 10.1016/j.spmi.2017.11.049
• Languages: English
• ISSNs: 0749-6036

Abstract

Abstract: An accurate behavioral model is presented to simulate important statistical performance of single-photon avalanche diodes (SPADs), such as dark count and after-pulsing noise. The derived simulation model takes into account all important generation mechanisms of the two kinds of noise. For the first time, thermal agitation, trap-assisted tunneling and band-to-band tunneling mechanisms are simultaneously incorporated in the simulation model to evaluate dark count behavior of SPADs fabricated in deep sub-micron CMOS technology. Meanwhile, a complete carrier trapping and de-trapping process is considered in afterpulsing model and a simple analytical expression is derived to estimate after-pulsing probability. In particular, the key model parameters of avalanche triggering probability and electric field dependence of excess bias voltage are extracted from Geiger-mode TCAD simulation and this behavioral simulation model doesn't include any empirical parameters. The developed SPAD model is implemented in Verilog-A behavioral hardware description language and successfully operated on commercial Cadence Spectre simulator, showing good universality and compatibility. The model simulation results are in a good accordance with the test data, validating high simulation accuracy.