Impact of stacking order on the microstructural properties of Cu2ZnGeSe4 thin film absorber layer. (May 2018)
- Record Type:
- Journal Article
- Title:
- Impact of stacking order on the microstructural properties of Cu2ZnGeSe4 thin film absorber layer. (May 2018)
- Main Title:
- Impact of stacking order on the microstructural properties of Cu2ZnGeSe4 thin film absorber layer
- Authors:
- Mary, G. Swapna
Chandra, G. Hema
Sunil, M. Anantha
Subbaiah, Y.P. Venkata
Gupta, Mukul
Rao, R. Prasada - Abstract:
- Abstract: Six possible multiple stacks of Cu-ZnSe-Ge with selenium incorporation at a precursor stage were prepared using electron beam evaporation followed by vacuum selenization at 475 °C for 30 min to investigate the role of stacking order on the growth and properties of Cu2 ZnGeSe4 films. The X-ray diffraction measurements affirm the existence of various binary and ternary phases (ZnSe, Cu2 Se, GeSe2 and Cu2 GeSe3 ) for all the precursor stacks. These phases are completely diminished after selenization at 475 °C except a minor co-existence of ZnSe (111) phase along with dominant Cu2 ZnGeSe4 (112) phase for stack A: (Cu/Se/ZnSe/Se/Ge/Se) × 4. The Raman measurements for selenized multiple stack A, revealed two major A 3, A 1 modes at 206 cm −1 and 176 cm −1 and one minor E 5 mode at 270 cm −1 corresponding to CZGSe phase. The surface morphology and the elemental distribution across the thickness found to vary significantly with the change of stacking order. The selenized multiple stacks A films shows densely packed flake and capsule shaped grains. The selenized stack A found to have a direct energy band gap of 1.60 eV, showing p -type conductivity with a Hall mobility of 22 cm 2 (Vs) −1 . Highlights: CZGSe thin films are prepared by selenization of multiple stacks using of Cu-ZnSe-Ge at 475 °C for 30 min. Effect of stacking order on the composition, micro-structure, opto-electronic properties of CZGSe thin films was studied. Based in the SIMS, XRD, Raman and opticalAbstract: Six possible multiple stacks of Cu-ZnSe-Ge with selenium incorporation at a precursor stage were prepared using electron beam evaporation followed by vacuum selenization at 475 °C for 30 min to investigate the role of stacking order on the growth and properties of Cu2 ZnGeSe4 films. The X-ray diffraction measurements affirm the existence of various binary and ternary phases (ZnSe, Cu2 Se, GeSe2 and Cu2 GeSe3 ) for all the precursor stacks. These phases are completely diminished after selenization at 475 °C except a minor co-existence of ZnSe (111) phase along with dominant Cu2 ZnGeSe4 (112) phase for stack A: (Cu/Se/ZnSe/Se/Ge/Se) × 4. The Raman measurements for selenized multiple stack A, revealed two major A 3, A 1 modes at 206 cm −1 and 176 cm −1 and one minor E 5 mode at 270 cm −1 corresponding to CZGSe phase. The surface morphology and the elemental distribution across the thickness found to vary significantly with the change of stacking order. The selenized multiple stacks A films shows densely packed flake and capsule shaped grains. The selenized stack A found to have a direct energy band gap of 1.60 eV, showing p -type conductivity with a Hall mobility of 22 cm 2 (Vs) −1 . Highlights: CZGSe thin films are prepared by selenization of multiple stacks using of Cu-ZnSe-Ge at 475 °C for 30 min. Effect of stacking order on the composition, micro-structure, opto-electronic properties of CZGSe thin films was studied. Based in the SIMS, XRD, Raman and optical measurements the location of secondary phases was illustrated. The selenized multiple stacks A films shows densely packed flake and capsule shaped grains. … (more)
- Is Part Of:
- Superlattices and microstructures. Volume 117(2018)
- Journal:
- Superlattices and microstructures
- Issue:
- Volume 117(2018)
- Issue Display:
- Volume 117, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 117
- Issue:
- 2018
- Issue Sort Value:
- 2018-0117-2018-0000
- Page Start:
- 437
- Page End:
- 448
- Publication Date:
- 2018-05
- Subjects:
- Cu2ZnGeSe4 thin films -- Selenization of stacked layers -- Micro Raman analysis -- Optical properties -- Electrical properties
Superlattices as materials -- Periodicals
Microstructure -- Periodicals
Semiconductors -- Periodicals
Superréseaux -- Périodiques
Microstructure (Physique) -- Périodiques
Semiconducteurs -- Périodiques
621.38152 - Journal URLs:
- http://www.sciencedirect.com/science/journal/07496036 ↗
http://www.elsevier.com/journals ↗ - DOI:
- 10.1016/j.spmi.2018.03.065 ↗
- Languages:
- English
- ISSNs:
- 0749-6036
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8547.076700
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 11478.xml