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HARVARD Citation
Liu, X. et al. (n.d.). A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing. Journal of micromechanics and microengineering. p. . [Online].
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Liu, X. et al. (n.d.). A novel scanning force microscopy probe with thermal-electrical actuation and piezo-resistive sensing. Journal of micromechanics and microengineering. p. . [Online].