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APA Citation
Bendt, G., Kaiser, K., Heckel, A., Rieger, F., Oing, D., Lorke, A., Rodriguez, N. P., Schierning, G., Jooss, C., & Schulz, S. (n.d.). structural and thermoelectrical characterization of epitaxial Sb2Te3 high quality thin films grown by thermal evaporation. Semiconductor science and technology, 33, . http://access.bl.uk/ark:/81055/vdc_100087635819.0x000050