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HARVARD Citation
Bendt, G. et al. (n.d.). Structural and thermoelectrical characterization of epitaxial Sb2Te3 high quality thin films grown by thermal evaporation. Semiconductor science and technology. p. . [Online].
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Bendt, G. et al. (n.d.). Structural and thermoelectrical characterization of epitaxial Sb2Te3 high quality thin films grown by thermal evaporation. Semiconductor science and technology. p. . [Online].