Cite
HARVARD Citation
Cretu, B. et al. (n.d.). Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures. Semiconductor science and technology. p. . [Online].
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Cretu, B. et al. (n.d.). Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures. Semiconductor science and technology. p. . [Online].