Risk of tin whiskers in the nuclear industry. (February 2018)

• Record Type: Journal Article
• Authors: Huang, Chien-Ming; Nunez, Daniel; Coburn, James; Pecht, Michael
• Is Part Of: Microelectronics and reliability. Volume 81(2018)
• Page Start: 22
• Page End: 30
• Publication Date: 2018-02
• Subjects: Lead-free -- Nuclear industry -- Reliability -- RoHS -- Tin whisker; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2017.12.019
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This paper identifies tin whisker-related faults and failures that have been reported in the nuclear power industry and discusses the unique reliability and safety challenges faced by nuclear power plants. Specific areas of concern include supply chain and parts selection, fault reporting, regulations and measurement techniques, and the adoption of lead-free legislation. Issues of parts availability and obsolescence are also discussed. The paper concludes with strategies and recommendations that can be used to mitigate and manage risks from tin whiskers in the nuclear industry.