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APA Citation
Zhang, V., Faucher, M., Theron, D., Morelle, C., & Buchaillot, L. (n.d.). improved analytical modelling and finite element verification of stressed GaN microbeam resonators by piezoelectric actuation. Journal of micromechanics and microengineering, 27, . http://access.bl.uk/ark:/81055/vdc_100087555221.0x000034