Cite
MLA Citation
Erwin Hüger et al.. “Neutron reflectometry to measure in situ the rate determining step of lithium ion transport through thin silicon layers and interfaces.” Physical chemistry chemical physics, vol. 21, no. 30, 2019, pp. 16444–16450. http://access.bl.uk/ark:/81055/vdc_100088842506.0x00004e