Cite
HARVARD Citation
Choi, B. et al. (n.d.). Effect of charge trap layer thickness on the charge spreading behavior within a few seconds in 3D charge trap flash memory. Semiconductor science and technology. p. . [Online].
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Choi, B. et al. (n.d.). Effect of charge trap layer thickness on the charge spreading behavior within a few seconds in 3D charge trap flash memory. Semiconductor science and technology. p. . [Online].