Cite
MLA Citation
Jekwan Lee et al.. “Highly efficient computer algorithm for identifying layer thickness of atomically thin 2D materials.” Journal of physics, vol. 51, 2018, p. . http://access.bl.uk/ark:/81055/vdc_100087651131.0x00005d
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Jekwan Lee et al.. “Highly efficient computer algorithm for identifying layer thickness of atomically thin 2D materials.” Journal of physics, vol. 51, 2018, p. . http://access.bl.uk/ark:/81055/vdc_100087651131.0x00005d