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HARVARD Citation
Tu, Y. et al. (2017). Atom probe tomographic assessment of the distribution of germanium atoms implanted in a silicon matrix through nano-apertures. Nanotechnology. p. . [Online].
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Tu, Y. et al. (2017). Atom probe tomographic assessment of the distribution of germanium atoms implanted in a silicon matrix through nano-apertures. Nanotechnology. p. . [Online].