Cite
MLA Citation
S.Y. Kim et al.. “Characterization of the Goubau line for testing beam diagnostic instruments.” Journal of instrumentation, vol. 12, n.d., p. P12016. http://access.bl.uk/ark:/81055/vdc_100087648417.0x000026
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S.Y. Kim et al.. “Characterization of the Goubau line for testing beam diagnostic instruments.” Journal of instrumentation, vol. 12, n.d., p. P12016. http://access.bl.uk/ark:/81055/vdc_100087648417.0x000026