Cite
HARVARD Citation
Kim, S. et al. (n.d.). Characterization of the Goubau line for testing beam diagnostic instruments. Journal of instrumentation. p. P12016. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Kim, S. et al. (n.d.). Characterization of the Goubau line for testing beam diagnostic instruments. Journal of instrumentation. p. P12016. [Online].