Cite
HARVARD Citation
Hattori, R. et al. (2018). Optical discrimination of threading dislocations in 4H-SiC epitaxial layer by phase-contrast microscopy. Applied physics express. p. . [Online].
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Hattori, R. et al. (2018). Optical discrimination of threading dislocations in 4H-SiC epitaxial layer by phase-contrast microscopy. Applied physics express. p. . [Online].