Cite
HARVARD Citation
Atkin, E. et al. (n.d.). Development of a low-noise readout ASIC for Silicon Drift Detectors in high energy resolution X-ray spectrometry. Journal of instrumentation. p. C03039. [Online].
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Atkin, E. et al. (n.d.). Development of a low-noise readout ASIC for Silicon Drift Detectors in high energy resolution X-ray spectrometry. Journal of instrumentation. p. C03039. [Online].